2020年6月1日 · Our main investigations are aimed to deeply in-situ study the perovskite film growth dynamics using synchrotron radiation GIXRD technology in combination with a customized mini online glove box (c (H 2 O,O 2)<1 ppm) and temperature-humidity control equipment, and so on., which should provide solid theoretical background and point to the useful d...

2022年5月25日 · Applications of XRD techniques in characterizing perovskite thin films are demonstrated for both three-dimensional and layered hybrid perovskites, covering various microstructural aspects including phase identification and quantification, texture analysis, microstrain, and macrostrain as well as in situ and operando characterization.

2023年6月2日 · In this work, we perform a systematic in situ XRD study on the dynamic formation and conversion processes of tandem-relevant FA 0.85 Cs 0.15 Pb (I 0.78 Br 0.22) 3 perovskite films, deposited via the hybrid evaporation/spin-coating …

2024年7月23日 · Quasi-two-dimensional (Q-2D) perovskite exhibits exceptional photoelectric properties and demonstrates reduced ion migration compared to 3D perovskite, making it a promising material for the...

The effect of antisolvent on the orientation of perovskite films with different bandgaps was investigated by X-ray diffraction (XRD) and grazing-incidence wide-angle X-ray scattering (GIWAXS).

2021年1月1日 · The Crystallinity and structural degradation of perovskite film can be studied using θ-2 θ XRD measurements in the lab. The XRD measurement profile is obtained from Bruker D2 with CuK α source (λ = 1.54 Å) with step size of 0.02° and holding time of 5 s per step.

2021年9月16日 · X-ray diffraction (XRD) is one of the most powerful tools for the characterization of the perovskite structure. It was carried out (details shown in the Experimental Section) in this study to gain insights into the component of thin films fabricated via magnetron sputtering.

2022年3月16日 · In this paper, we have explored synchrotron-based soft X-ray characterization as an effective technique for the compositional analysis of MHP thin films.

2022年7月28日 · The XRD and SEM results showed that more PbI 2 was formed after heating of the control perovskite film (figs. S5 and S6). We found that integration of the XRD intensity ratio of PbI 2 /perovskite in the control film increased from 0.42 to 0.98 after aging whereas the PIRC film remained at ~0.10.

2020年10月1日 · In this paper, we have systematically deployed the X-ray diffraction (XRD) technique to extract the recrystallization and defect formation at the surface of the perovskite film and the protective impact of the reduced graphene oxide in reducing the defect formation at air exposure accelerated under light.