More information: Koh Saitoh et al, Surface sensitivity of atomic-resolution secondary electron imaging, Microscopy (2024).

When the primary beam strikes the sample, it produces ‘secondary electrons’, which ionize the gas, creating more secondary electrons as well as positive ions. The additional electrons serve to amplify ...

Any secondary electron detected is a result of that spot’s composition, no matter where you collect them. Common detectors pick up back-scattered electrons bouncing back toward the electron source.

These secondary electron images contain information on the topography of the sample. As can be seen on the left of the figure below, the beam here is scanned on top of a surface with a protrusion and ...

Enjoy a new generation of secondary electron (SE) detectors. Obtain images with up to 50% more signal. Benefit from the novel C2D and VPSE detectors of Sigma in variable pressure mode: ...

The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

In electronic work, we usually are using SEM that detects secondary electron emissions because it is hard to shoot an electron through an electronic component. But STEM is a cool technology that ...

Researchers used atomic-resolution secondary electron (SE) imaging to capture the atomic structure of the very top layer of materials to better understand the differences from its lower layers. Share: ...