Secondary electron imaging is the most popular mode of operation of the scanning electron microscope (SEM), with myriads of images being recorded every day, many of which find their way into ...

These secondary electron images contain information on the topography of the sample. As can be seen on the left of the figure below, the beam here is scanned on top of a surface with a protrusion and ...

Typical position of the backscattered and secondary electron detectors. Secondary Electrons. In contrast, secondary electrons originate from the surface or the near-surface regions of the sample. They ...

More information: Koh Saitoh et al, Surface sensitivity of atomic-resolution secondary electron imaging, Microscopy (2024).

New research from physicists at Peking University, China, suggests that some pulsars may have massive mountains on them, ...

The emitted secondary electrons provide information on specimen morphology and topography; the angle of secondary electron emission is affected by the angle of incidence. An important factor in SEM is ...

Researchers used atomic-resolution secondary electron (SE) imaging to capture the atomic structure of the very top layer of materials to better understand the differences from its lower layers. Share: ...

Any secondary electron detected is a result of that spot’s composition, no matter where you collect them. Common detectors pick up back-scattered electrons bouncing back toward the electron source.

The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...

JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the release of scanning electron microscopes JSM-IT710HR/JSM-IT210 on July 23, 2023. S ...

A research team at City University of Hong Kong (CityU) is pioneering advanced technology for the next-generation self-design and manufacture of electron microscopes (EMs). CityU is the first ...