Typical position of the backscattered and secondary electron detectors. Secondary Electrons. In contrast, secondary electrons originate from the surface or the near-surface regions of the sample. They ...

These secondary electron images contain information on the topography of the sample. As can be seen on the left of the figure below, the beam here is scanned on top of a surface with a protrusion and ...

More information: Koh Saitoh et al, Surface sensitivity of atomic-resolution secondary electron imaging, Microscopy (2024).

Researchers used atomic-resolution secondary electron (SE) imaging to capture the atomic structure of the very top layer of materials to better understand the differences from its lower layers. Share: ...

Secondary electron images of volcanic ash from a volcanic plume in the crater rim of Villarrica volcano, Chile, collected using an air filter. Scale bars - 1μm. The Ultra Plus scanning electron ...

Any secondary electron detected is a result of that spot’s composition, no matter where you collect them. Common detectors pick up back-scattered electrons bouncing back toward the electron source.

High- and low-vacuum mode secondary electron images of an impact crater in a solar cell on the Hubble Space Telescope. Secondary electron and backscattered electron images of a fossil foram. This ...

A research team at City University of Hong Kong (CityU) is pioneering advanced technology for the next-generation self-design and manufacture of electron microscopes (EMs). CityU is the first ...