In electronics work, the scanning electron microscope (SEM) is the most common. You hit something with electrons and watch for secondary electron emissions. However, biologists more often use a ...

The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

Secondary electron images of volcanic ash from a volcanic plume in the crater rim of Villarrica volcano, Chile, collected using an air filter. Scale bars - 1μm. The Ultra Plus scanning electron ...